• Computers

Automatic Layout Modification

Including design reuse of the Alpha CPU in 0.13 micron SOI technology
Author: Michael Reinhardt
Publisher: Springer Science & Business Media
ISBN: 0306475170
Category: Computers
Page: 226
View: 4990
This volume is a welcome effort towards improving some of the practices in chip design today. The authors provide a comprehensive reference work on Automatic Layout Modification which will be valuable to VLSI courses at universities, and to CAD and circuit engineers and engineering managers.


Forthcoming Books


Author: R.R. Bowker Company. Department of Bibliography
Publisher: N.A
ISBN: N.A
Category:
Page: N.A
View: 7538

    • Technology & Engineering

ESD

RF Technology and Circuits
Author: Steven H. Voldman
Publisher: John Wiley & Sons
ISBN: 0470061391
Category: Technology & Engineering
Page: 420
View: 9665
With the growth of high-speed telecommunications and wireless technology, it is becoming increasingly important for engineers to understand radio frequency (RF) applications and their sensitivity to electrostatic discharge (ESD) phenomena. This enables the development of ESD design methods for RF technology, leading to increased protection against electrical overstress (EOS) and ESD. ESD: RF Technology and Circuits: Presents methods for co-synthesizisng ESD networks for RF applications to achieve improved performance and ESD protection of semiconductor chips; discusses RF ESD design methods of capacitance load transformation, matching network co-synthesis, capacitance shunts, inductive shunts, impedance isolation, load cancellation methods, distributed loads, emitter degeneration, buffering and ballasting; examines ESD protection and design of active and passive elements in RF complementary metal-oxide-semiconductor (CMOS), RF laterally-diffused metal oxide semiconductor (LDMOS), RF BiCMOS Silicon Germanium (SiGe), RF BiCMOS Silicon Germanium Carbon (SiGeC), and Gallim Arsenide technology; gives information on RF ESD testing methodologies, RF degradation effects, and failure mechanisms for devices, circuits and systems; highlights RF ESD mixed-signal design integration of digital, analog and RF circuitry; sets out examples of RF ESD design computer aided design methodologies; covers state-of-the-art RF ESD input circuits, as well as voltage-triggered to RC-triggered ESD power clamps networks in RF technologies, as well as off-chip protection concepts. Following the authors series of books on ESD, this book will be a thorough overview of ESD in RF technology for RF semiconductor chip and ESD engineers. Device and circuit engineers working in the RF domain, and quality, reliability and failure analysis engineers will also find it a valuable reference in the rapidly growing are of RF ESD design. In addition, it will appeal to graduate students in RF microwave technology and RF circuit design.

    • Technology & Engineering

Power Aware Design Methodologies


Author: Massoud Pedram,Jan M. Rabaey
Publisher: Springer Science & Business Media
ISBN: 0306481391
Category: Technology & Engineering
Page: 522
View: 7242
Power Aware Design Methodologies was conceived as an effort to bring all aspects of power-aware design methodologies together in a single document. It covers several layers of the design hierarchy from technology, circuit logic, and architectural levels up to the system layer. It includes discussion of techniques and methodologies for improving the power efficiency of CMOS circuits (digital and analog), systems on chip, microelectronic systems, wirelessly networked systems of computational nodes and so on. In addition to providing an in-depth analysis of the sources of power dissipation in VLSI circuits and systems and the technology and design trends, this book provides a myriad of state-of-the-art approaches to power optimization and control. The different chapters of Power Aware Design Methodologies have been written by leading researchers and experts in their respective areas. Contributions are from both academia and industry. The contributors have reported the various technologies, methodologies, and techniques in such a way that they are understandable and useful.

    • Computers

Upgrading and Repairing PCs


Author: Scott Mueller
Publisher: Que Publishing
ISBN: 0132682184
Category: Computers
Page: 1200
View: 7273
“…a comprehensive resource for PC enthusiasts and professionals alike. Packed with the latest speeds and feeds, you’ll want to keep this book on-hand as an authoritative technology reference.” –Chris Angelini, Managing Editor, Tom’s Hardware For 20 years, Upgrading and Repairing PCs has been the world’s #1 guide to PC hardware: the single source for reliable information on troubleshooting and fixing problems, adding hardware, optimizing performance, and building new PCs. Now, better than ever, this 20th Edition offers beefed-up coverage of the newest hardware innovations and maintenance techniques, plus more than 90 minutes of new DVD video. Scott Mueller delivers practical answers about PC processors, motherboards, buses, BIOSes, memory, storage, video, audio, I/O, input devices, networks, Internet connectivity, power, and much more. You’ll find the industry’s best coverage of diagnostics, testing, and repair–plus cutting-edge discussions of improving performance via overclocking and other techniques. Mueller has taught thousands of professionals in person and millions more through his books and videos–nobody knows more about keeping PCs running perfectly. Whether you’re a professional technician, a small business owner trying to save money, or a home PC enthusiast, this is the only PC hardware book you need! NEW IN THIS EDITION The newest processors, including Intel’s 2nd generation Core i3, i5, i7 plus the Atom, and AMD’s new VISION series CPUs 3TB (and larger) disks, 4K sectoring, partition alignment, faster SATA disk interfaces, and SSD (Solid State Drive) hard drive replacements New firmware innovations, from full UEFI BIOS support to built-in motherboard flash BIOS upgrade utilities Integrated video and audio, including 5.1/7.1 surround sound, HDMI, and DisplayPort connections Updated PCI Express and Power Supply specifications for powering high-end video cards Emerging interfaces such as USB 3.0 and Thunderbolt Updated coverage of building PCs from scratch–from choosing and assembling hardware through BIOS setup and troubleshooting ON THE DVD Get more than 90 minutes of up-to-the minute, studio quality how-to videos–all playable on your DVD player or computer! In this edition, Scott Mueller offers true insider information about several of the key components in a PC, including hard disk drives, power supplies, motherboards, and more. You will see hard drives completely dissected–even see an open hard drive in operation–so you can observe exactly what happens under the covers. One of the most common causes of failure in modern motherboards, power supplies, and many other PC components are bad capacitors–otherwise known as the capacitor plague. Mueller will show several real-world examples of this “disease,” so you can easily identify and perhaps even repair the problem. Finally, because external hard drives are now commonly used for supplementary storage and backups, you’ll find a complete discussion of several alternatives on the market. This includes tips and tricks for building or assembling your own flexible, high performance and highly reliable external storage drives, with several examples shown. This DVD also contains the complete 19th edition of this book in printable form, plus extensive technical reference material, a comprehensive glossary, and more!

    • Technology & Engineering

Low-Power CMOS Circuits

Technology, Logic Design and CAD Tools
Author: Christian Piguet
Publisher: CRC Press
ISBN: 1420036505
Category: Technology & Engineering
Page: 440
View: 867
The power consumption of microprocessors is one of the most important challenges of high-performance chips and portable devices. In chapters drawn from Piguet's recently published Low-Power Electronics Design, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools addresses the design of low-power circuitry in deep submicron technologies. It provides a focused reference for specialists involved in designing low-power circuitry, from transistors to logic gates. The book is organized into three broad sections for convenient access. The first examines the history of low-power electronics along with a look at emerging and possible future technologies. It also considers other technologies, such as nanotechnologies and optical chips, that may be useful in designing integrated circuits. The second part explains the techniques used to reduce power consumption at low levels. These include clock gating, leakage reduction, interconnecting and communication on chips, and adiabatic circuits. The final section discusses various CAD tools for designing low-power circuits. This section includes three chapters that demonstrate the tools and low-power design issues at three major companies that produce logic synthesizers. Providing detailed examinations contributed by leading experts, Low-Power CMOS Circuits: Technology, Logic Design, and CAD Tools supplies authoritative information on how to design and model for high performance with low power consumption in modern integrated circuits. It is a must-read for anyone designing modern computers or embedded systems.

    • Computers

Layout Optimization in VLSI Design


Author: Bing Lu,Ding-Zhu Du,S. Sapatnekar
Publisher: Springer Science & Business Media
ISBN: 1475734158
Category: Computers
Page: 288
View: 9877
Introduction The exponential scaling of feature sizes in semiconductor technologies has side-effects on layout optimization, related to effects such as inter connect delay, noise and crosstalk, signal integrity, parasitics effects, and power dissipation, that invalidate the assumptions that form the basis of previous design methodologies and tools. This book is intended to sample the most important, contemporary, and advanced layout opti mization problems emerging with the advent of very deep submicron technologies in semiconductor processing. We hope that it will stimulate more people to perform research that leads to advances in the design and development of more efficient, effective, and elegant algorithms and design tools. Organization of the Book The book is organized as follows. A multi-stage simulated annealing algorithm that integrates floorplanning and interconnect planning is pre sented in Chapter 1. To reduce the run time, different interconnect plan ning approaches are applied in different ranges of temperatures. Chapter 2 introduces a new design methodology - the interconnect-centric design methodology and its centerpiece, interconnect planning, which consists of physical hierarchy generation, floorplanning with interconnect planning, and interconnect architecture planning. Chapter 3 investigates a net-cut minimization based placement tool, Dragon, which integrates the state of the art partitioning and placement techniques.

    • Technology & Engineering

Laser Precision Microfabrication


Author: Koji Sugioka,Michel Meunier,Alberto Piqué
Publisher: Springer
ISBN: 9783642105234
Category: Technology & Engineering
Page: 344
View: 6269
Miniaturization and high precision are rapidly becoming a requirement for many industrial processes and products. As a result, there is greater interest in the use of laser microfabrication technology to achieve these goals. This book composed of 16 chapters covers all the topics of laser precision processing from fundamental aspects to industrial applications to both inorganic and biological materials. It reviews the sate of the art of research and technological development in the area of laser processing.

    • Technology & Engineering

System-on-Chip Test Architectures

Nanometer Design for Testability
Author: Laung-Terng Wang,Charles E. Stroud,Nur A. Touba
Publisher: Morgan Kaufmann
ISBN: 9780080556802
Category: Technology & Engineering
Page: 896
View: 7078
Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students.

    • Technology & Engineering

CMOS VLSI Engineering

Silicon-on-Insulator (SOI)
Author: James B. Kuo,Ker-Wei Su
Publisher: Springer Science & Business Media
ISBN: 1475728239
Category: Technology & Engineering
Page: 422
View: 7252
Silicon-On-Insulator (SOI) CMOS technology has been regarded as another major technology for VLSI in addition to bulk CMOS technology. Owing to the buried oxide structure, SOI technology offers superior CMOS devices with higher speed, high density, and reduced second order effects for deep-submicron low-voltage, low-power VLSI circuits applications. In addition to VLSI applications, and because of its outstanding properties, SOI technology has been used to realize communication circuits, microwave devices, BICMOS devices, and even fiber optics applications. CMOS VLSI Engineering: Silicon-On-Insulator addresses three key factors in engineering SOI CMOS VLSI - processing technology, device modelling, and circuit designs are all covered with their mutual interactions. Starting from the SOI CMOS processing technology and the SOI CMOS digital and analog circuits, behaviors of the SOI CMOS devices are presented, followed by a CAD program, ST-SPICE, which incorporates models for deep-submicron fully-depleted mesa-isolated SOI CMOS devices and special purpose SOI devices including polysilicon TFTs. CMOS VLSI Engineering: Silicon-On-Insulator is written for undergraduate senior students and first-year graduate students interested in CMOS VLSI. It will also be suitable for electrical engineering professionals interested in microelectronics.

    • Computers

Progress in VLSI Design and Test

16th International Symposium on VSLI Design and Test, VDAT 2012, Shipur, India, July 1-4, 2012, Proceedings
Author: Hafizur Rahaman,Sanatan Chattopadhyay,Santanu Chattopadhyay
Publisher: Springer
ISBN: 3642314945
Category: Computers
Page: 408
View: 6685
This book constitutes the refereed proceedings of the 16th International Symposium on VSLI Design and Test, VDAT 2012, held in Shibpur, India, in July 2012. The 30 revised regular papers presented together with 10 short papers and 13 poster sessions were carefully selected from 135 submissions. The papers are organized in topical sections on VLSI design, design and modeling of digital circuits and systems, testing and verification, design for testability, testing memories and regular logic arrays, embedded systems: hardware/software co-design and verification, emerging technology: nanoscale computing and nanotechnology.

    • Technology & Engineering

Industrializing Additive Manufacturing - Proceedings of Additive Manufacturing in Products and Applications - AMPA2017


Author: Mirko Meboldt,Christoph Klahn
Publisher: Springer
ISBN: 3319668668
Category: Technology & Engineering
Page: 362
View: 9363
These proceedings exchange ideas and knowledge among engineers, designers and managers on how to support real-world value chains by developing additive manufactured series products. The papers from the conference show a holistic, multidisciplinary view.

    • Medical

Radiation Detectors for Medical Applications


Author: Stefaan Tavernier,Alexander Gektin,Boris Grinyov,William W. Moses
Publisher: Springer Science & Business Media
ISBN: 1402050933
Category: Medical
Page: 307
View: 8820
The topic of this book is the use of scintillating materials in the detection of ionising radiation for medical imaging. The text surveys the state of the art in radiation detectors for medical imaging, followed by an in-depth review of all aspects of the use of scintillating materials. Also included are detailed discussion of ways to improve the performance of existing scintillating materials and completely novel uses of scintillating materials.

    • Computers

Pro C# 7

With .NET and .NET Core
Author: Andrew Troelsen,Philip Japikse
Publisher: Apress
ISBN: 9781484230176
Category: Computers
Page: 1372
View: 882
This essential classic title provides a comprehensive foundation in the C# programming language and the frameworks it lives in. Now in its 8th edition, you’ll find all the very latest C# 7.1 and .NET 4.7 features here, along with four brand new chapters on Microsoft’s lightweight, cross-platform framework, .NET Core, up to and including .NET Core 2.0. Coverage of ASP.NET Core, Entity Framework (EF) Core, and more, sits alongside the latest updates to .NET, including Windows Presentation Foundation (WPF), Windows Communication Foundation (WCF), and ASP.NET MVC. Dive in and discover why Pro C# has been a favorite of C# developers worldwide for over 15 years. Gain a solid foundation in object-oriented development techniques, attributes and reflection, generics and collections as well as numerous advanced topics not found in other texts (such as CIL opcodes and emitting dynamic assemblies). With the help of this book you’ll have the confidence to put C# into practice and explore the .NET universe on your own terms. What You Will Learn Discover the latest C# 7.1 features, from tuples to pattern matching Hit the ground running with Microsoft’s lightweight, open source .NET Core platform, including ASP.NET Core MVC, ASP.NET Core web services, and Entity Framework Core Find complete coverage of XAML, .NET 4.7, and Visual Studio 2017 Understand the philosophy behind .NET and the new, cross-platform alternative, .NET Core

    • Computers

Simulation of Semiconductor Processes and Devices 2004

Sispad 2004
Author: Gerhard Wachutka,Gabriele Schrag
Publisher: Springer Science & Business Media
ISBN: 9783211224687
Category: Computers
Page: 374
View: 4618
This volume contains the proceedings of the 10th edition of the International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2004), held in Munich, Germany, on September 2-4, 2004. The conference program included 7 invited plenary lectures and 82 contributed papers for oral or poster presentation, which were carefully selected out of a total of 151 abstracts submitted from 14 countries around the world. Like the previous meetings, SISPAD 2004 provided a world-wide forum for the presentation and discussion of recent advances and developments in the theoretical description, physical modeling and numerical simulation and analysis of semiconductor fabrication processes, device operation and system performance. The variety of topics covered by the conference contributions reflects the physical effects and technological problems encountered in consequence of the progressively shrinking device dimensions and the ever-growing complexity in device technology.

    • Computers

VLSI Design and Test

17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings
Author: Singh Manoj Gaur,Mark Zwolinski,Vijay Laxmi,D. Boolchandani,Virendra Sing,Adit Singh
Publisher: Springer
ISBN: 3642420249
Category: Computers
Page: 388
View: 8057
This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.

    • Computers

Introduction to Deep Learning

From Logical Calculus to Artificial Intelligence
Author: Sandro Skansi
Publisher: Springer
ISBN: 3319730045
Category: Computers
Page: 191
View: 3767
This textbook presents a concise, accessible and engaging first introduction to deep learning, offering a wide range of connectionist models which represent the current state-of-the-art. The text explores the most popular algorithms and architectures in a simple and intuitive style, explaining the mathematical derivations in a step-by-step manner. The content coverage includes convolutional networks, LSTMs, Word2vec, RBMs, DBNs, neural Turing machines, memory networks and autoencoders. Numerous examples in working Python code are provided throughout the book, and the code is also supplied separately at an accompanying website. Topics and features: introduces the fundamentals of machine learning, and the mathematical and computational prerequisites for deep learning; discusses feed-forward neural networks, and explores the modifications to these which can be applied to any neural network; examines convolutional neural networks, and the recurrent connections to a feed-forward neural network; describes the notion of distributed representations, the concept of the autoencoder, and the ideas behind language processing with deep learning; presents a brief history of artificial intelligence and neural networks, and reviews interesting open research problems in deep learning and connectionism. This clearly written and lively primer on deep learning is essential reading for graduate and advanced undergraduate students of computer science, cognitive science and mathematics, as well as fields such as linguistics, logic, philosophy, and psychology.

    • Technology & Engineering

Theory of Matrix Structural Analysis


Author: J. S. Przemieniecki
Publisher: Courier Corporation
ISBN: 0486649482
Category: Technology & Engineering
Page: 468
View: 514
This classic text begins with an overview of matrix methods and their application to the structural design of modern aircraft and aerospace vehicles. Subsequent chapters cover basic equations of elasticity, energy theorems, structural idealization, a comparison of force and displacement methods, analysis of substructures, structural synthesis, nonlinear structural analysis, and other topics. 1968 edition.

    • Technology & Engineering

Materials and Failures in MEMS and NEMS


Author: Atul Tiwari,Baldev Raj
Publisher: John Wiley & Sons
ISBN: 1119083869
Category: Technology & Engineering
Page: 432
View: 2047
The fabrication of MEMS has been predominately achieved by etching the polysilicon material. However, new materials are in large demands that could overcome the hurdles in fabrication or manufacturing process. Although, an enormous amount of work being accomplished in the area, most of the information is treated as confidential or privileged. It is extremely hard to find the meaningful information for the new or related developments. This book is collection of chapters written by experts in MEMS and NEMS technology. Chapters are contributed on the development of new MEMS and NEMS materials as well as on the properties of these devices. Important properties such as residual stresses and buckling behavior in the devices are discussed as separate chapters. Various models have been included in the chapters that studies the mode and mechanism of failure of the MEMS and NEMS. This book is meant for the graduate students, research scholars and engineers who are involved in the research and developments of advanced MEMS and NEMS for a wide variety of applications. Critical information has been included for the readers that will help them in gaining precise control over dimensional stability, quality, reliability, productivity and maintenance in MEMS and NEMS. No such book is available in the market that addresses the developments and failures in these advanced devices.